Tanvi Gujarati, Mario Motta, et al.
ACS Fall 2022
Fast feedback from cryogenic electrical characterization measurements is key for the development of scalable quantum computing technology. At room temperature, high-throughput device testing is accomplished with a probe-based solution, where electrical probes are repeatedly positioned onto devices for acquiring statistical data. In this work, we present a probe station that can be operated from room temperature down to below 2 K. Its small size makes it compatible with standard cryogenic measurement setups with a magnet. A large variety of electronic devices can be tested. Here, we demonstrate the performance of the prober by characterizing silicon fin field-effect transistors as a host for quantum dot spin qubits. Such a tool can massively accelerate the design-fabrication-measurement cycle and provide important feedback for process optimization toward building scalable quantum circuits.
Tanvi Gujarati, Mario Motta, et al.
ACS Fall 2022
Daniil Frolov, Sudipto Chakraborty, et al.
IMS 2024
Youngseok Kim, Andrew Eddins, et al.
APS March Meeting 2023
Zlatko Minev
APS March Meeting 2021