Conference paper
Modeling polarization for Hyper-NA lithography tools and masks
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
Summary form only given. The full leverage offered by E-beam lithography has been exploited in a 0.25- mu m bipolar process. The tight overlay capability was shown to provide a significant advantage in shrinking the overall transistor size. In conjunction with a device technology optimized to provide a 33-GHz 0.25- mu m-emitter device, this culminated in the achievement of an ECL (emitter coupled logic) delay of 24 ps at a switching current of only 1.1 mA.
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
John G. Long, Peter C. Searson, et al.
JES
J.H. Comfort, E.F. Crabbe, et al.
IEDM 1991
E. Burstein
Ferroelectrics