I.M. Abe Elfadel, Alina Deutsch, et al.
IEEE Transactions on Advanced Packaging
An electrical probe based on specially designed coaxial tips is shown to have 24-GHz bandwidth. It can be used to test high-speed signal propagation on planar or nonplanar chip or package interconnection structures with signal/ground pads as small as 50 µm. The detailed fabrication procedure, characterization, and use of the probe are presented. A variation of the design has 500-Ω input impedance and a bandwidth of 19 GHz. © 1990 IEEE
I.M. Abe Elfadel, Alina Deutsch, et al.
IEEE Transactions on Advanced Packaging
Albert X. Widmer, Kevin Wrenner, et al.
IEEE Journal of Solid-State Circuits
Alina Deutsch, Thomas-Michael Winkel, et al.
IEEE Transactions on Advanced Packaging
Barry J. Rubin, Gerard V. Kopcsay
Journal of Applied Physics