P. Martensson, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Carbon doping of AlxGa1-xAs with x = 0 to 0.3 has been investigated using trimethylarsine (TMAs) as the carbon precursor. Carbon concentrations from 5×1017 to {reversed tilde equals} 1020cm-3 have been achieved using AsH3/TMAs mixtures or TMAs alone. The carbon concentration increases with aluminum composition and decreasing AsH3/TMAs ratio. A contraction in the lattice constant is observed for carbon concentrations larger than {reversed tilde equals} 1018 cm-3 which is attributed to substitutional carbon. The carbon incorporation is non-uniform at higher carbon concentrations. The electrical activation of carbon in (Al,Ga)As is however, very low, of the order of 5%. © 1991.
P. Martensson, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
F.J. Himpsel, T.A. Jung, et al.
Surface Review and Letters
M.A. Lutz, R.M. Feenstra, et al.
Surface Science
J.A. Barker, D. Henderson, et al.
Molecular Physics