Martine D. F. Schlag, Ellen J. Yoffa, et al.
IEEE TCADIS
Because wiring a chip is so time consuming, it is highly desirable to be able to evaluate a particular placement of macros on a chip in terms of its wirability, or choose among several candidate placements, prior to any actual wiring. A method is presented to do this. The expected wire congestion is derived and the critical areas exposed, thereby enabling improvement of the chip layout. © 1985.
Martine D. F. Schlag, Ellen J. Yoffa, et al.
IEEE TCADIS
A.K. Mabatah, Ellen J. Yoffa, et al.
Physical Review B
Peter S. Hauge, Ellen J. Yoffa
DAC 1986
James J. Rosenberg, Ellen J. Yoffa, et al.
IEEE T-ED