Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
Experimental tests have been carried out for characterizing the performance of a new single-photon avalanche diode. The detector is specifically designed for picosecond time-correlated single photon counting, aiming to obtain a time response free from the tail effects and/or secondary bumps observed in all other available single-photon detectors. The experimental results confirm that an unprecedented ultraclean response is attained, with full width at half maximum (FWHM) of 35 ps, full width at a thousandth of the peak count of 214 ps, together with a photon detection efficiency of 35% around 580-nm wavelength.
Joy Y. Cheng, Daniel P. Sanders, et al.
SPIE Advanced Lithography 2008
A. Ney, R. Rajaram, et al.
Journal of Magnetism and Magnetic Materials
David B. Mitzi
Journal of Materials Chemistry
K.N. Tu
Materials Science and Engineering: A