Hot-carrier luminescence: Comparison of different CMOS technologies
- Alberto Tosi
- Franco Stellari
- et al.
- 2003
- ESSDERC 2003
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6 results for Sergio Cova
Backside flip-chip testing by means of high-bandwidth luminescence detection
- A. Tosi
- F. Stellari
- et al.
- 2003
- Microelectronics Reliability
CMOS circuit analysis with luminescence measurements and simulations
- F. Stellari
- A. Tosi
- et al.
- 2002
- ESSDERC 2002
Testing CMOS circuits at 50ps resolution with single-photon avalanche detectors
- S. Cova
- C. Porta
- et al.
- 2000
- ESSDERC 2000
High-speed CMOS circuit testing by 50 ps time-resolved luminescence measurements
- Franco Stellari
- Franco Zappa
- et al.
- 2001
- IEEE Transactions on Electron Devices
Avalanche detector with ultraclean response for time-resolved photon counting
- Alessandro Spinelli
- Massimo A. Ghioni
- et al.
- 1998
- IEEE JQE