David B. Mitzi
Journal of Materials Chemistry
Using a 50 mW HeNe infrared laser as the light source and a micro channel-plate image intensifier/converter, grown-in dislocations were observed in 2 to 3 mm thick silicon (111) slices. All the dislocations imaged followed the visibility criteria set by Tanner and Fathers (1974) for pure edge dislocations. © 1979 Taylor & Francis Group, LLC.
David B. Mitzi
Journal of Materials Chemistry
S.F. Fan, W.B. Yun, et al.
Proceedings of SPIE 1989
S. Cohen, T.O. Sedgwick, et al.
MRS Proceedings 1983
Eloisa Bentivegna
Big Data 2022