K.N. Tu
Materials Science and Engineering: A
Using a 50 mW HeNe infrared laser as the light source and a micro channel-plate image intensifier/converter, grown-in dislocations were observed in 2 to 3 mm thick silicon (111) slices. All the dislocations imaged followed the visibility criteria set by Tanner and Fathers (1974) for pure edge dislocations. © 1979 Taylor & Francis Group, LLC.
K.N. Tu
Materials Science and Engineering: A
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
Julien Autebert, Aditya Kashyap, et al.
Langmuir
D.D. Awschalom, J.-M. Halbout
Journal of Magnetism and Magnetic Materials