Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
We have measured the cluster-size distribution in thin Al-Al2O3 films near the metal-insulator transition for sheet resistances of about 1000 Ω and metal area fraction of the order of 0.5. Our results show for the first time that this distribution follows a power-law dependence and that the perimeter-to-area ratio is approximately constant for large clusters. We find good quantitative agreement between our obseryations and the predictions of percolation theory. © 1982 The American Physical Society.
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
Thomas E. Karis, C. Mark Seymour, et al.
Rheologica Acta
B.A. Hutchins, T.N. Rhodin, et al.
Surface Science
Fernando Marianno, Wang Zhou, et al.
INFORMS 2021