M.O. Aboelfotoh, A. Alessandrini, et al.
Applied Physics Letters
The effect of the mechanical constraints exerted by coatings upon electromigration in thin films is evaluated on the basis of known pressure effects upon diffusion. © 1972 The American Institute of Physics.
M.O. Aboelfotoh, A. Alessandrini, et al.
Applied Physics Letters
J.E.E. Baglin, F.M. D'Heurle, et al.
Journal of Applied Physics
O.C. Wells, R.J. Savoy
Scanning
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Applied Physics Letters