PaperFormation of iridium silicides from Ir thin films on Si substratesS. Petersson, J.E.E. Baglin, et al.Journal of Applied Physics
PaperScanning reflection image from a solid specimen in the scanning electron microscope with a condenser‐objective lensO.C. WellsScanning
PaperAnomalous large grains in alloyed aluminum thin films I. Secondary grain growth in aluminum-copper filmsA. Gangulee, F.M. D'HeurleThin Solid Films
PaperPrecisions on reaction monitoring from in-situ resistance measurements: Relations between such measurements and actual reaction kineticsS.-L. Zhang, F.M. D'HeurleThin Solid Films