F.M. D'Heurle
Metallurgical and Materials Transactions B
The effect of the mechanical constraints exerted by coatings upon electromigration in thin films is evaluated on the basis of known pressure effects upon diffusion. © 1972 The American Institute of Physics.
F.M. D'Heurle
Metallurgical and Materials Transactions B
S.K. Lahiri, O.C. Wells
Applied Physics Letters
O. Thomas, F.M. D'Heurle, et al.
Applied Surface Science
L. Clevenger, B. Arcot, et al.
Journal of Applied Physics