D. Pohl, W. Kaiser
Physical Review B
Aperture scanning near-field optical microscopy (SNOM/NSOM) and scanning tunneling optical microscopy (STOM, also known as PSTM) are integrated into an instrument which combines the advantages of both schemes. As a result, more near-field optical information can be obtained and new modes of operation become possible. Scan images of a glass surface with a fine grating relief demonstrate some of the capabilities of the new 'TNOM' technique. © 1995 Elsevier Science B.V. All rights reserved.
D. Pohl, W. Kaiser
Physical Review B
D. Pohl
Institute of Physics Electron Microscopy and Analysis Group Conference 1991
L. Novotny, D. Pohl, et al.
Journal of the Optical Society of America A: Optics and Image Science, and Vision
U. Dürig, J.K. Gimzewski, et al.
Physical Review Letters