R.D. Murphy, R.O. Watts
Journal of Low Temperature Physics
In this paper we describe a novel method of eliminating charging during the high resolution SEM inspection and dimensional measurements of x-ray and optical masks. A soluble conducting polymer, polyaniline, is spin-coated on the mask and found to prevent charging even at 15 KV. This method is a non-destructive process in contrast to the commonly used technique of metal deposition, since the polymer can be cleanly removed without any damage to the mask. © 1991.
R.D. Murphy, R.O. Watts
Journal of Low Temperature Physics
R. Ghez, J.S. Lew
Journal of Crystal Growth
J.H. Kaufman, Owen R. Melroy, et al.
Synthetic Metals
Robert W. Keyes
Physical Review B