Robert L. Bruce, Gloria Fraczak, et al.
SPIE Advanced Lithography 2017
We have demonstrated, for the first time, a combination of outstanding linearity of analog programming with matched PCM pairs, small analog programming noise, an extremely low resistance drift (R-drift) coefficient (0.005, median) and high endurance for a CVD-based confined phase change memory (PCM) with a thin metallic liner. In-depth analysis of linear analog programming is also presented. MNIST simulations using a pair of these confined PCM devices as a synaptic element yield a high test accuracy of 95%.
Robert L. Bruce, Gloria Fraczak, et al.
SPIE Advanced Lithography 2017
Dominik Metzler, Florian Weilnboeck, et al.
JVSTB
Nanbo Gong, W. Chien, et al.
VLSI Technology 2020
Amlan Majumdar, Yanning Sun, et al.
IEEE T-ED