A. Paccagnella, A.C. Callegari, et al.
IEEE T-ED
Evidence is presented to show that the degradation of near-band-gap photoluminescence emission in GaAs with time of exposure to low power, cw laser excitation can be attributed to a surface mechanism that is independent of surface oxidation and may involve an interaction between crystal point defects and the photogenerated electron-hole plasma near the surface.
A. Paccagnella, A.C. Callegari, et al.
IEEE T-ED
H.J. Hovel
JES
F. Assaderaghi, G. Shahidi, et al.
VLSI Technology 1996
S.M. Vernon, A.E. Blakeslee, et al.
JES