Conference paper
Substrate engineering for germanium-based CMOS technology
S.W. Bedell, K.E. Fogel, et al.
ECS Meeting 2006
Conference paper
Development of stacking faults in strained silicon layers
Related
K.L. Saenger, J.P. De Souza, et al.
ECS Meeting 2007
D.K. Sadana, M. Yang, et al.
ECS Meeting 2006
Conference paper
A survey of defects in strained Si layers
S.W. Bedell, H. Chen, et al.
MRS Proceedings 2004