D. Gupta, K.N. Tu, et al.
Thin Solid Films
Paper
Diffusion in the amorphous phase of Pd-19-at.%-Si metallic alloy
Abstract
Diffusion of Ag110m radioactive tracer has been measured in amorphous Pd-19-at.%-Si specimens characterized by a Seeman-Bohlin x-ray diffractometer. The diffusion parameters in this metallic amorphous phase have been found to have a regime distinctly different from liquid and crystalline phases. © 1975 The American Physical Society.
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