Fernando Marianno, Wang Zhou, et al.
INFORMS 2021
Evaporated Pd80Si20 and sputtered Gd16Co84 amorphous films were studied for structural relaxation during annealing with a Seeman-Bohlin X-ray diffractometer and for atomic diffusion using radioactive Au195 and Co57 tracers. The diffusion parameters for these two kinds of films with pre-annealing are presented. © 1982.
Fernando Marianno, Wang Zhou, et al.
INFORMS 2021
Heinz Schmid, Hans Biebuyck, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
J.C. Marinace
JES
A. Reisman, M. Berkenblit, et al.
JES