S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
Evaporated Pd80Si20 and sputtered Gd16Co84 amorphous films were studied for structural relaxation during annealing with a Seeman-Bohlin X-ray diffractometer and for atomic diffusion using radioactive Au195 and Co57 tracers. The diffusion parameters for these two kinds of films with pre-annealing are presented. © 1982.
S. Cohen, J.C. Liu, et al.
MRS Spring Meeting 1999
P. Alnot, D.J. Auerbach, et al.
Surface Science
A.B. McLean, R.H. Williams
Journal of Physics C: Solid State Physics
Gregory Czap, Kyungju Noh, et al.
APS Global Physics Summit 2025