PaperReduction of penetration effect at sharp edges in the scanning electron microscope (SEM)Oliver C. Wells, Phillip J. BaileyJournal of Microscopy
PaperExamination of uncoated photoresist by the low-loss electron method in the scanning electron microscopeOliver C. Wells, Ping-Chin ChengJournal of Applied Physics
PaperApplication of the low-loss scanning electron microscope image to integrated circuit technology part II - Chemically-mechanically planarized samplesOliver C. Wells, Maurice McGlashan-Powell, et al.Scanning
