PaperMethod for measuring the field from a magnetic recording head in the scanning electron microscopeOliver C. WellsJournal of Microscopy
PaperIsolation of type-2 magnetic contrast in the SEM by a lock-in techniqueOliver C. WellsApplied Physics Letters
PaperUse of backscattered electron detector arrays for forming backscattered electron images in the scanning electron microscopeOliver C. Wells, L. Gignac, et al.Scanning
