Microscopy and Microanalysis

Paper

01 Nov 2002

Discussion of ways to energy-filter the electron backscattering pattern (EBSP) in the scanning electron microscope (SEM)

Abstract

No abstract available.

Paper

Fundamental theorem for type‐1 magnetic contrast in the scanning electron microscope (SEM)

Oliver C. Wells

Journal of Microscopy

Paper

Application of the low-loss scanning electron microscope image to integrated circuit technology part II - Chemically-mechanically planarized samples

Oliver C. Wells, Maurice McGlashan-Powell, et al.

Scanning

Conference paper

The history and future of the SEM - A personal view

Oliver C. Wells

M&M 2006

Paper

Method for measuring the field from a magnetic recording head in the scanning electron microscope

Oliver C. Wells

Journal of Microscopy

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