R. Ghez, M.B. Small
JES
Self-diffusion measurements have been made in polycrystalline Au-1.2 at.% Ta alloy over the temperature range 204°-395.5 °C using 195Au radioactive tracer and r.f. backsputtering techniques for serial sectioning. Self-diffusion coefficients were obtained in the lattice, dislocation networks (subgrains) and large angle grain boundaries and these yielded Arrhenius parameters for the three diffusion processes. A small addition of Ta to Au was found to have profound effects on Au diffusion in the lattice and along grain boundaries. © 1975.
R. Ghez, M.B. Small
JES
O.F. Schirmer, W. Berlinger, et al.
Solid State Communications
Imran Nasim, Melanie Weber
SCML 2024
Elizabeth A. Sholler, Frederick M. Meyer, et al.
SPIE AeroSense 1997