Chu R. Wie, G. Burns, et al.
Nuclear Inst. and Methods in Physics Research, B
The light-emitting diodes described in this Letter differ from standard type diodes insofar as the amphoteric dopant Si is the dominant impurity on both sides of the junction. The p-n junction is completely solution regrown. The highly compensated p region gives rise to a wide active region up to 50 μ in width. The interesting feature of these diodes is their high external quantum efficiencies at 300°K. Values up to 6% have been measured on diodes, when an antireflecting coat has been applied. © 1966 The American Institute of Physics.
Chu R. Wie, G. Burns, et al.
Nuclear Inst. and Methods in Physics Research, B
S. Chang, I.M. Vitomirov, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
M.H. Pilkuhn, H. Rupprecht
Journal of Applied Physics
K. Mahalingam, N. Otsuka, et al.
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures