M. Chen, V. Marrello, et al.
Physical Review B
We report a direct measurement of relative Mn electroluminescence (EL) efficiency in an ac EL device as a function of position normal to the ZnS film plane. The Mn EL efficiency decreases strongly with distance from the cathodic to anodic region of the ZnS layer. The cathodic-to-anodic efficiency ratio is about two orders of magnitude. In addition, the first ∼0.2 μm of ZnS deposited exhibits a significantly lower Mn EL efficiency relative to the remaining ZnS.
M. Chen, V. Marrello, et al.
Physical Review B
V. Marrello, M. Chen, et al.
CLEO 1982
W. Rühle, V. Marrello, et al.
Journal of Electronic Materials
R. Fern, A.A. Onton
Journal of Applied Physics