Two-regime ablative hole formation process in tellurium and tellurium-alloy films
- M. Chen
- V. Marrello
- et al.
- 1989
- Proceedings of SPIE 1989
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19 results for V. Marrello
Pulse Width Transfer Function of Tellurium -Alloy Disks
- M. Chen
- V. Marrello
- 1989
- Proceedings of SPIE 1989
Characterization of optical recording disk noise
- M. Chen
- A.E. Bell
- et al.
- 1989
- Proceedings of SPIE 1989
Mapping of defects on apical recording disks
- V. Marrello
- M. Chen
- et al.
- 1982
- CLEO 1982
The effect of overcoats on the ablative writing characteristics of tellurium films
- M. Chen
- V. Marrello
- 1980
- Optical Storage Materials 1980
The Dependence of the Memory Effect in ZnS:Mn A-C Thin Film Electroluminescence on Mn Distribution
- V. Marrello
- A.A. Onton
- 2019
- JES
Refractive index of BaTiO3 and SrTiO3 films
- M. Wöhlecke
- V. Marrello
- et al.
- 2008
- Journal of Applied Physics
The memory effect of ZnS: Mn ac thin-film electroluminescence
- V. Marrello
- W. Rühle
- et al.
- 2008
- Applied Physics Letters
Electroluminescence efficiency profiles of Mn in ZnS ac thin-film electroluminescence devices
- V. Marrello
- A.A. Onton
- 2008
- Applied Physics Letters
Domain electroluminescence in ac thin-film devices
- H. Rüfer
- V. Marrello
- et al.
- 2008
- Journal of Applied Physics