T.F. Kuech, E.D. Marshall, et al.
Journal of Crystal Growth
The reliability of molten KOH for revealing dislocations intersecting {100} faces of GaAs has been tested using transmission x-ray topography. It is found to be a "faithful" etch.
T.F. Kuech, E.D. Marshall, et al.
Journal of Crystal Growth
N.I. Buchan, T.F. Kuech, et al.
Journal of Electronic Materials
T.F. Kuech, R.M. Potemski
Applied Physics Letters
T.F. Kuech, R.M. Potemski, et al.
Journal of Electronic Materials