Conference paper
AUTOMATED MICRODENSITOMETER FOR DIGITIZING ASTRONOMICAL PLATES.
J. Angilello, Wei-Hwan Chiang, et al.
Astronomical Microdensitometry Conference 1983
Paper
Etch pits and dislocations in {100} GaAs wafers
Abstract
The reliability of molten KOH for revealing dislocations intersecting {100} faces of GaAs has been tested using transmission x-ray topography. It is found to be a "faithful" etch.
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