T.F. Kuech, M.S. Goorsky, et al.
Journal of Crystal Growth
The reliability of molten KOH for revealing dislocations intersecting {100} faces of GaAs has been tested using transmission x-ray topography. It is found to be a "faithful" etch.
T.F. Kuech, M.S. Goorsky, et al.
Journal of Crystal Growth
C.C. Han, X.Z. Wang, et al.
Applied Physics Letters
Masanori Murakami, H.-C.W. Huang, et al.
Journal of Applied Physics
M.B. Small, R. Ghez, et al.
JES