W.J. Kozlovsky, A.G. Dewey, et al.
SPIE Optical Data Storage Topical Meeting 1992
Direct photoetching of various resists and polymers with a 193-nm ArF excimer laser has been demonstrated by imaging a mask through a projection lens. Feature sizes ranging from 2 to 20 μm have been cleanly etched in 1-μm-thick films.
W.J. Kozlovsky, A.G. Dewey, et al.
SPIE Optical Data Storage Topical Meeting 1992
M.R. Latta, K. Jain
Optics Communications
M.R. Latta, T.C. Strand, et al.
SPIE Optical Data Storage Topical Meeting 1992
K. Jain, S. Rice, et al.
Polymer Engineering & Science