Reliability Challenges with Materials for Analog Computing
Eduard Cartier, Wanki Kim, et al.
IRPS 2019
We measure the M/# and the bit-error rate of a digital holographic storage system with a 4f optical arrangement for three configurations: recording at the Fourier plane with and without a phase mask and recording outside the Fourier plane without a phase mask. Unexpectedly, no significant change in the dynamic range was observed when a phase mask was used to record in thick crystals. However, we show that a phase mask is a key component in a 4f digital holographic storage system if high-fidelity holograms with optimum volumetric density are to be stored. © 1998 Optical Society of America.
Eduard Cartier, Wanki Kim, et al.
IRPS 2019
Geoffrey W. Burr, Abu Sebastian, et al.
APL Materials
Geoffrey W. Burr, Erwin Mecher, et al.
Proceedings of SPIE - The International Society for Optical Engineering
Geoffrey W. Burr
Optics Letters