PaperScaling, Small Numbers and Randomness in SemiconductorsRobert W. KeyesIEEE Circuits and Devices Magazine
PaperPhysical limits of silicon transistors and circuitsRobert W. KeyesReports on Progress in Physics
PaperStress Dependence of the Frequency of Quartz PlatesRobert W. Keyes, Fred W. BlairProceedings of the IEEE
