Sufi Zafar, Christopher P. D’Emic, et al.
ACS Nano
Extraction and analysis of external resistance (Rext) have become increasingly important in modern CMOS technology research. We show that with certain assumptions, the well-known shift-and-ratio method can be extended and still be useful for Rext extraction in short-channel devices. Its application to advanced FinFET devices in both simulation and hardware is presented.
Sufi Zafar, Christopher P. D’Emic, et al.
ACS Nano
Miaomiao Wang, Zuoguang Liu, et al.
IRPS 2015
Zuoguang Liu, Heng Wu, et al.
VLSI Technology 2019
Oleg Gluschenkov, Zuoguang Liu, et al.
IEDM 2016