PaperApplication of the low-loss scanning electron microscope image to integrated circuit technology part II - Chemically-mechanically planarized samplesOliver C. Wells, Maurice McGlashan-Powell, et al.Scanning
PaperCollector turret for scanning electron microscopeOliver C. Wells, Conrad G. BremerReview of Scientific Instruments
PaperDiscussion of ways to energy-filter the electron backscattering pattern (EBSP) in the scanning electron microscope (SEM)Oliver C. WellsMicroscopy and Microanalysis
PaperExamination of uncoated photoresist by the low-loss electron method in the scanning electron microscopeOliver C. Wells, Ping-Chin ChengJournal of Applied Physics
