PaperMethod for measuring the field from a magnetic recording head in the scanning electron microscopeOliver C. WellsJournal of Microscopy
PaperReduction of penetration effect at sharp edges in the scanning electron microscope (SEM)Oliver C. Wells, Phillip J. BaileyJournal of Microscopy
PaperTop-down topography of deeply etched silicon in the scanning electron microscopeOliver C. Wells, Conal E. Murray, et al.Review of Scientific Instruments
