Journal of Microscopy

Paper

02 Aug 2011

Fundamental theorem for type‐1 magnetic contrast in the scanning electron microscope (SEM)

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Abstract

No abstract available.

Paper

Reduction of penetration effect at sharp edges in the scanning electron microscope (SEM)

Oliver C. Wells, Phillip J. Bailey

Journal of Microscopy

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Application of the low-loss scanning electron microscope image to integrated circuit technology part II - Chemically-mechanically planarized samples

Oliver C. Wells, Maurice McGlashan-Powell, et al.

Scanning

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Method for measuring the field from a magnetic recording head in the scanning electron microscope

Oliver C. Wells

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An irradiation effect in thermally grown SiO₂

Oliver C. Wells

Applied Physics Letters

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