Journal of Microscopy

Paper

02 Aug 2011

Fundamental theorem for type‐1 magnetic contrast in the scanning electron microscope (SEM)

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Abstract

No abstract available.

Paper

Isolation of type-2 magnetic contrast in the SEM by a lock-in technique

Oliver C. Wells

Applied Physics Letters

Conference paper

The fiftieth anniversary of the first applications of the scanning electron microscope in materials research

Kenneth C.A. Smith, Oliver C. Wells, et al.

IC-CPO 2006

Paper

Examination of uncoated photoresist by the low-loss electron method in the scanning electron microscope

Oliver C. Wells, Ping-Chin Cheng

Journal of Applied Physics

Paper

Discussion of ways to energy-filter the electron backscattering pattern (EBSP) in the scanning electron microscope (SEM)

Oliver C. Wells

Microscopy and Microanalysis

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