PaperExamining deep holes by rocking the beam in the scanning electron microscopeOliver C. WellsReview of Scientific Instruments
Conference paperPast, present, and future of backscatter electron (BSE) imagingOliver C. Wells, Michael S. Gordon, et al.ScMi 2012
ReviewEffects of collector take‐off angle and energy filtering on the BSE image in the SEMOliver C. WellsScanning
PaperUse of backscattered electron detector arrays for forming backscattered electron images in the scanning electron microscopeOliver C. Wells, L. Gignac, et al.Scanning