Review

09 Aug 2011

Effects of collector take‐off angle and energy filtering on the BSE image in the SEM

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Abstract

No abstract available.

Paper

Examining deep holes by rocking the beam in the scanning electron microscope

Oliver C. Wells

Review of Scientific Instruments

Paper

Use of backscattered electron detector arrays for forming backscattered electron images in the scanning electron microscope

Oliver C. Wells, L. Gignac, et al.

Scanning

Paper

Relationship between type‐1 magnetic contrast in the scanning electron microscope and the vector potential of the magnetic field

Oliver C. Wells, Catherine A. Stoye

Journal of Microscopy

Paper

Application of the low-loss scanning electron microscope image to integrated circuit technology part II - Chemically-mechanically planarized samples

Oliver C. Wells, Maurice McGlashan-Powell, et al.

Scanning

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