Conference paperThe fiftieth anniversary of the first applications of the scanning electron microscope in materials researchKenneth C.A. Smith, Oliver C. Wells, et al.IC-CPO 2006
PaperApplication of the low-loss scanning electron microscope image to integrated circuit technology part II - Chemically-mechanically planarized samplesOliver C. Wells, Maurice McGlashan-Powell, et al.Scanning
PaperDiscussion of ways to energy-filter the electron backscattering pattern (EBSP) in the scanning electron microscope (SEM)Oliver C. WellsMicroscopy and Microanalysis
PaperMagnetic Domains in Thin-Film Recording Heads as Observed in the SEM by a Lock-In TechniqueOliver C. Wells, Richard J. SavoyIEEE Transactions on Magnetics
