PublicationIEEE International SOI Conference 1992Conference paperHot-carrier reliability of fully depleted accumulation mode SOI MOSFETSIEEE International SOI Conference 1992View publicationAbstractNo abstract available.Home↳ PublicationsDate06 Oct 1992PublicationIEEE International SOI Conference 1992AuthorsA. AcovicL.K. WangF.T. BradyN. HaddadIBM-affiliated at time of publicationShare
