Sandip Tiwari, Steven L. Wright
IEEE Electron Device Letters
Paper
IIA-6 Sensitivity of Threshold Voltage and Sheet Carrier Concentration to Material and Electronic Parameters in a HEMT Device
Abstract
No abstract available.
Related
Sandip Tiwari, D.J. Frank, et al.
Journal of Applied Physics
Sandip Tiwari, Farhan Rana, et al.
Applied Physics Letters
Brian A. Bryce, Mark C. Reuter, et al.
Nano Letters