Sandip Tiwari, Steven L. Wright
IEEE Electron Device Letters
Paper
IIIA-2 Simulation and Analysis of Recombination and Grading Effects in GaAlAs/GaAs HBT's
Abstract
No abstract available.
Related
Conference paper
Growth and scaling of oxide conduction after breakdown
Barry P. Linder, James H. Stathis, et al.
IRPS 2003
Leland Chang, David J. Frank, et al.
Proceedings of the IEEE
Sandip Tiwari, G. David Pettit, et al.
Applied Physics Letters