Conference paper
Hardness assurance testing for proton direct ionization effects
James R. Schwank, Marty R. Shaneyfelt, et al.
RADECS 2011
We use ray tracing software to model various levels of spacecraft shielding complexity and energy deposition pulse height analysis to study how it affects the direct ionization soft error rate of microelectronic components in space. The analysis incorporates the galactic cosmic ray background, trapped proton, and solar heavy ion environments as well as the October 1989 and July 2000 solar particle events. © 2010 IEEE.
James R. Schwank, Marty R. Shaneyfelt, et al.
RADECS 2011
Jonathan A. Pellish, Michael A. Xapsos, et al.
IEEE TNS
Jonathan A. Pellish, Michael A. Xapsos, et al.
RADECS 2009
Aj Kleinosowski, Ethan H. Cannon, et al.
IEEE TNS