Conference paper
Compression for data archiving and backup revisited
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
Some integrated circuit manufacturing processes produce variation which is strongly correlated between devices physically near each other but not correlated between devices which are widely separated. Devices separated by intermediate distances are partial correlated. In this paper we describe a method to characterize and model variation which shows this type of spatial correlations. © 2011 Elsevier Ltd. All rights reserved.
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
F.J. Himpsel, T.A. Jung, et al.
Surface Review and Letters
Oliver Schilter, Alain Vaucher, et al.
Digital Discovery
Michael Ray, Yves C. Martin
Proceedings of SPIE - The International Society for Optical Engineering