M.A. Lutz, R.M. Feenstra, et al.
Surface Science
Interdiffusion in PbIn thin film couples has been examined by an X-ray diffraction technique. Initial results indicate that the interdiffusion in such couples is significantly faster than that expected from reported bulk data. © 1975.
M.A. Lutz, R.M. Feenstra, et al.
Surface Science
J. Paraszczak, J.M. Shaw, et al.
Micro and Nano Engineering
Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
William G. Van der Sluys, Alfred P. Sattelberger, et al.
Polyhedron