E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
Interdiffusion in PbIn thin film couples has been examined by an X-ray diffraction technique. Initial results indicate that the interdiffusion in such couples is significantly faster than that expected from reported bulk data. © 1975.
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering
L.K. Wang, A. Acovic, et al.
MRS Spring Meeting 1993
Revanth Kodoru, Atanu Saha, et al.
arXiv
J.V. Harzer, B. Hillebrands, et al.
Journal of Magnetism and Magnetic Materials