Peilin Song, Franco Stellari, et al.
ISTFA 2004
Paper
Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops
Abstract
Excessive "jitter," caused primarily by power supply noise, can detract from the advantages of phase-locked loops. Moreover, in a multichip system, the accumulated phase error must be measured - not just the jitter.
Related
Linda M. Geppert, David F. Heidel, et al.
IEEE Journal of Solid-State Circuits
Conference paper
Characteristics of submicron MOS varactors
Keith A. Jenkins, Herschel Ainspan
SiRF 2006
John D. Cressler, James Warnock, et al.
IEEE Electron Device Letters