Mehmet Soyuer, Keith A. Jenkins, et al.
IEEE Journal of Solid-State Circuits
Paper
Measuring Jitter and Phase Error in Microprocessor Phase-Locked Loops
Abstract
Excessive "jitter," caused primarily by power supply noise, can detract from the advantages of phase-locked loops. Moreover, in a multichip system, the accumulated phase error must be measured - not just the jitter.
Related
Christos Dimitrakopoulos, Yu-Ming Lin, et al.
Journal of Vacuum Science and Technology B
Keith A. Jenkins, David F. Heidel
Microelectronic Engineering
Keith A. Jenkins, Damon B. Farmer, et al.
Applied Physics Letters