Bruno Schuler, Gerhard Meyer, et al.
JACS
We present a method that enables atomic-resolution measurements of the short-range force field above a single organic admolecule using noncontact atomic force microscopy. We have extended the standard force-mapping technique to be able to measure at close tip-molecule distances, in regions that cannot be accessed by normal constant-height or constant-frequency-shift imaging. Our technique can be used to study the interaction between a well-defined scanning probe tip and an admolecule on the atomic scale and yields atomic resolution of both molecule and substrate. Furthermore, it enables the measurement of constant-frequency-shift topographies of molecules with nonplanar adsorption geometries. © 2011 American Institute of Physics.
Bruno Schuler, Gerhard Meyer, et al.
JACS
Fabian Schulz, Mario Commodo, et al.
Proc. Combust. Inst.
Leo Gross
APS March Meeting 2023
Niko Pavliček, Bruno Schuler, et al.
Nature Chemistry