H.D. Dulman, R.H. Pantell, et al.
Physical Review B
The electron photo-excitation from the K- state and its subsequent trapping by K+ state is probably at the origin of the silicon dangling bonds (K0) formation during broad-band UV illumination of the N-rich amorphous silicon nitride films. Because the photo-excited electron will move towards the metal electrode the positive charge is expected to accumulate near the nitride-silicon interface with illumination time. Our data also suggest that the N-H group may be at the origin of the nitrogen dangling bonds creation in N-rich films. © 1991 Elsevier Science Publishers B.V. All rights reserved.
H.D. Dulman, R.H. Pantell, et al.
Physical Review B
O.F. Schirmer, W. Berlinger, et al.
Solid State Communications
Michiel Sprik
Journal of Physics Condensed Matter
T.N. Morgan
Semiconductor Science and Technology