C. Schönenberger, S.F. Alvarado, et al.
Journal of Applied Physics
Paper
Nanometer resolution in luminescence microscopy of III-V heterostructures
Abstract
In a scanning tunneling microscope experiment, the luminescence induced by the recombination of holes with electrons tunneling into cleaved (110) GaAs/AlGaAs heterostructures is used to image the interface region with nanometer resolution.
Related
C. Schönenberger, S.F. Alvarado, et al.
Journal of Applied Physics
C. Schönenberger, S.F. Alvarado
Physical Review Letters
C. Schönenberger, S.F. Alvarado
Review of Scientific Instruments