PaperSeparation of magnetic and topographic effects in force microscopyC. Schönenberger, S.F. Alvarado, et al.Journal of Applied Physics
PaperScanning tunneling microscopy as a tool to study surface roughness of sputtered thin filmsC. Schönenberger, S.F. Alvarado, et al.Journal of Applied Physics
PaperA differential interferometer for force microscopyC. Schönenberger, S.F. AlvaradoReview of Scientific Instruments
PaperObservation of single charge carriers by force microscopyC. Schönenberger, S.F. AlvaradoPhysical Review Letters