D.L. Abraham, A. Veider, et al.
Applied Physics Letters
Several techniques are presented which allow magnetic force microscopy to be performed while simultaneously mapping the surface topographic features of a magnetic sample. The separation of magnetic and topographic features measured simultaneously with a scanning force microscope is made possible by an instrument based on a differential interferometer that can detect cantilever deflections of 0.005 nm at a frequency as low as 1 Hz. Two different applications are presented.
D.L. Abraham, A. Veider, et al.
Applied Physics Letters
C. Schönenberger, S.F. Alvarado
Physical Review Letters
S.F. Alvarado, C. Carbone
Physica B+C
C. Schönenberger, S.F. Alvarado
Zeitschrift für Physik B Condensed Matter