C. Schönenberger, S.F. Alvarado, et al.
Journal of Applied Physics
Several techniques are presented which allow magnetic force microscopy to be performed while simultaneously mapping the surface topographic features of a magnetic sample. The separation of magnetic and topographic features measured simultaneously with a scanning force microscope is made possible by an instrument based on a differential interferometer that can detect cantilever deflections of 0.005 nm at a frequency as low as 1 Hz. Two different applications are presented.
C. Schönenberger, S.F. Alvarado, et al.
Journal of Applied Physics
M. Pfister, M. Johnson, et al.
Applied Physics Letters
I.L. Sanders, D.R. Wilhoit, et al.
Journal of Applied Physics
C. Schoenenberger, S.F. Alvarado, et al.
Journal of Magnetism and Magnetic Materials