T.G. Walker, A.W. Pang, et al.
Physical Review Letters
Several techniques are presented which allow magnetic force microscopy to be performed while simultaneously mapping the surface topographic features of a magnetic sample. The separation of magnetic and topographic features measured simultaneously with a scanning force microscope is made possible by an instrument based on a differential interferometer that can detect cantilever deflections of 0.005 nm at a frequency as low as 1 Hz. Two different applications are presented.
T.G. Walker, A.W. Pang, et al.
Physical Review Letters
S.E. Lambert, J.K. Howard, et al.
IEEE Transactions on Magnetics
M. Kemerink, S.F. Alvarado, et al.
MRS Proceedings 2003
M. Pfister, M. Johnson, et al.
Applied Surface Science