Darsen D. Lu, Chung-Hsun Lin, et al.
IEEE Design and Test of Computers
We present a methodology to generate performance-aware corner models (PAMs). Accuracy is improved by emphasizing electrical variation data and reconciling the process and electrical variation data. PAM supports corner (± σ and ±2σ) simulation and Monte Carlo simulation. Furthermore, PAM supports the practice of application-specific corner cards, for example, for gain-sensitive applications. © 2009 IEEE.
Darsen D. Lu, Chung-Hsun Lin, et al.
IEEE Design and Test of Computers
Chung-Hsun Lin, Wilfried Haensch, et al.
VLSI Technology 2011
Ruqiang Bao, Brian Greene, et al.
IEDM 2015
Sujata Paul, Frank Yeh, et al.
IEEE Electron Device Letters