Raymond Wu, Jie Lu
ITA Conference 2007
Photolithography using 193-nm light appears to be a viable route for the extension of optical lithography to the dimensions required for the manufacture of 1Gb DRAM and advanced CMOS microprocessors with 180-140-nm minimum feature sizes. In this paper, we discuss the origin of resist technology for 193-nm lithography and the current status of 193-nm photoresists, focusing on single-layer resist materials. We emphasize the photoresist design approaches under investigation, compare these with deep-UV (DUV) (248-nm) resist design and materials, and consider possible future lithography processes employing 193-nm lithography. Research and development on 193-nm photoresists by the lithography group at the IBM Almaden Research Center is highlighted.
Raymond Wu, Jie Lu
ITA Conference 2007
J.P. Locquet, J. Perret, et al.
SPIE Optical Science, Engineering, and Instrumentation 1998
Thomas M. Cover
IEEE Trans. Inf. Theory
Donald Samuels, Ian Stobert
SPIE Photomask Technology + EUV Lithography 2007