Conference paper
Modeling polarization for Hyper-NA lithography tools and masks
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
We present picosecond backside optical measurements of currents and voltages, propagation delays, and glitches in flip-chip mounted silicon IC's. These signals are shown to compare well with prior circuit simulations, but they showed additional features not easily simulated. © 1992.
Kafai Lai, Alan E. Rosenbluth, et al.
SPIE Advanced Lithography 2007
Ranulfo Allen, John Baglin, et al.
J. Photopolym. Sci. Tech.
Eloisa Bentivegna
Big Data 2022
Kigook Song, Robert D. Miller, et al.
Macromolecules