H. Stahl, J. Appenzeller, et al.
Materials Science and Engineering C
The influence of target texture on the backscattering yield of 2 MeV 4He particles has been investigated for evaported thin-film targets of Nb, Ag, Au and Bi. The results have been correlated with those from X-ray diffraction. The implications of the texture found for nuclear-backscattering analysis are discussed, and it is suggested that backscattering may constitute a fast, quantitative method for investigations of texture in thin foils. © 1978.
H. Stahl, J. Appenzeller, et al.
Materials Science and Engineering C
A.E. Ruehli, N. Kulasza, et al.
IEEE T-MTT
Toby G. Rossman, Ekaterina I. Goncharova, et al.
Mutation Research - Fundamental and Molecular Mechanisms of Mutagenesis
Marshall I. Nathan, John E. Smith Jr., et al.
Journal of Applied Physics