P. Martensson, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
The dielectric properties are reported for nanoporous thin films of poly(methyl silsesquioxane) (MSSQ) for use as an ultralow, dielectric intermetal insulator. Direct experimental conformation is provided that the films have low dielectric constants with low loss up to 10 GHz. Low-frequency measurements are also reported.
P. Martensson, R.M. Feenstra
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
J.A. Barker, D. Henderson, et al.
Molecular Physics
M. Hargrove, S.W. Crowder, et al.
IEDM 1998
J.R. Thompson, Yang Ren Sun, et al.
Physica A: Statistical Mechanics and its Applications