Diagnosis meets physical failure analysis: How long can we succeed?
- Anne Gattiker
- 2004
- IEEE ITC 2004
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4 results at IEEE ITC 2004
Random and systematic defect analysis using IDDQ signature analysis for understanding fails and guiding test decisions
- Phil Nigh
- Anne Gattiker
- 2004
- IEEE ITC 2004
CMOS IC diagnostics using the luminescence of OFF-state leakage currents
- Stas Polonsky
- Keith A. Jenkins
- et al.
- 2004
- IEEE ITC 2004
A novel scan chain diagnostics technique based on light emission from leakage current
- Peilin Song
- Franco Stellari
- et al.
- 2004
- IEEE ITC 2004