Sung Ho Kim, Oun-Ho Park, et al.
Small
The present status of ellipsometric measurement capability is reviewed. Significant advances since the last ellipsometry conference are highlighted. © 1980.
Sung Ho Kim, Oun-Ho Park, et al.
Small
Xikun Hu, Wenlin Liu, et al.
IEEE J-STARS
Thomas E. Karis, C. Mark Seymour, et al.
Rheologica Acta
R.D. Murphy, R.O. Watts
Journal of Low Temperature Physics