V.M. Hallmark, S. Chiang
Surface Science
Scanning tunneling microscopy (STM) has been used for many atomic-scale observations of metal and semiconductor surfaces. Experience has shown that a variety of effects must be considered in interpreting high-resolution data. For example, images may be distorted by the motion of tip or surface atoms which results from tip-surface interactions at small tunnel gaps. Lower-resolution studies generally appear to be quite reliable. Empirical limits on image interpretation are discussed for some of the metal, molecule and semiconductor systems which we have measured. © 1992.
V.M. Hallmark, S. Chiang
Surface Science
D.D. Chambliss, S. Chiang
Surface Science
R.J. Wilson, S. Chiang, et al.
Am. Chem. Soc., Div. Pet. Chem., Prepr.
V.M. Hallmark, S. Chiang, et al.
Physical Review Letters