Oliver Schilter, Alain Vaucher, et al.
Digital Discovery
Paper
Scanning tunneling microscopy
Abstract
Scanning tunneling microscopy, a novel technique based on vacuum tunneling, yields surface topographies in real space and work function profiles on an atomic sale. Surfaces are shown for Au(110), Si(111) and GaAs(111). © 1983.
Related
Ellen J. Yoffa, David Adler
Physical Review B
Conference paper
Compression for data archiving and backup revisited
Corneliu Constantinescu
SPIE Optical Engineering + Applications 2009
E. Babich, J. Paraszczak, et al.
Microelectronic Engineering