PaperComparison between the invariant line and structural ledge theories for predicting the habit plane, orientation relationship and interphase boundary structure of plate-shaped precipitatesJ.M. Howe, D.A. SmithActa Metallurgica Et Materialia
PaperIn situ studies of grain growth in thin metal filmsC.S. Nichols, C.M. Mansuri, et al.Acta Metallurgica Et Materialia
PaperA technique for comparing the bulk and surface structure of defects in thin films using the scanning transmission electron microscope.M.M.J. Treacy, W. Krakow, et al.Applied Physics Letters
PaperEffect of arsenic segregation on the electrical properties of grain boundaries in polycrystalline siliconC.Y. Wong, C.R.M. Grovenor, et al.Journal of Applied Physics
